Assignee
KOTAKI GO
JP·2 granted patents·2 pending applications·6 citations·filing 2009–2011
Top patents by PatentIndex Score
4 records- 0173US9343264B2Scanning electron microscope device and pattern dimension measuring method using sameKOTAKI GO·Filed 2010·Granted May 17, 2016·4 cites·9 claims
- 0262US9082585B2Defect observation method and device using SEMKOTAKI GO·Filed 2009·Granted Jul 14, 2015·2 cites·8 claims
- 0344US2013090560A1Ultrasound image reconstruction method, device therefor, and ultrasound diagnostic deviceKOTAKI GO·Filed 2011·Application pending·0 cites
- 0434US2013010100A1Image generating method and device using scanning charged particle microscope, sample observation method, and observing deviceKOTAKI GO·Filed 2011·Application pending·0 cites
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