Assignee
KOU YU
US·9 granted patents·41 citations·filing 2007–2012
Top patents by PatentIndex Score
9 records- 0194US8161347B1Interleaving parity bits into user bits to guarantee run-length constraintKOU YU·Filed 2007·Granted Apr 17, 2012·16 cites·20 claims
- 0282US8589760B1Defect scan and manufacture testKOU YU·Filed 2011·Granted Nov 19, 2013·7 cites·20 claims
- 0382US8281224B1Programmable LBA and dummy bit reliabilitiesKOU YU·Filed 2009·Granted Oct 2, 2012·4 cites·19 claims
- 0478US8898546B1Error recovery using erasures for NAND flashKOU YU·Filed 2012·Granted Nov 25, 2014·5 cites·21 claims
- 0577US8819524B2Manufacturing testing for LDPC codesKOU YU·Filed 2012·Granted Aug 26, 2014·3 cites·20 claims
- 0673US8266497B1Manufacturing testing for LDPC codesKOU YU·Filed 2009·Granted Sep 11, 2012·4 cites·21 claims
- 0767US8321750B2Interleaving parity bits into user bits to guarantee run-length constraintKOU YU·Filed 2012·Granted Nov 27, 2012·1 cites·17 claims
- 0855US8607132B1Matching signal dynamic range for turbo equalization systemKOU YU·Filed 2011·Granted Dec 10, 2013·1 cites·21 claims
- 0943US8914709B1Manufacturing testing for LDPC codesKOU YU·Filed 2011·Granted Dec 16, 2014·0 cites·15 claims
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