Assignee
KUITANI TETSUYA
JP·2 granted patents·1 pending application·4 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0171US8241929B2Contactor, contact structure, probe card, and test apparatusKUITANI TETSUYA·Filed 2011·Granted Aug 14, 2012·2 cites·11 claims
- 0269US8097475B2Method of production of a contact structureKUITANI TETSUYA·Filed 2010·Granted Jan 17, 2012·2 cites·17 claims
- 0342US2012133383A1Probe, probe card and electronic device testing apparatusKUITANI TETSUYA·Filed 2009·Application pending·0 cites
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