Assignee
KURJANOWICZ WLODEK
CA·13 granted patents·200 citations·filing 2007–2012
Top patents by PatentIndex Score
13 records- 0198US8526254B2Test cells for an unprogrammed OTP memory arrayKURJANOWICZ WLODEK·Filed 2011·Granted Sep 3, 2013·61 cites·20 claims
- 0295US9129687B2OTP memory cell having low current leakageKURJANOWICZ WLODEK·Filed 2010·Granted Sep 8, 2015·15 cites·20 claims
- 0395US8213211B2High reliability OTP memoryKURJANOWICZ WLODEK·Filed 2010·Granted Jul 3, 2012·26 cites·33 claims
- 0493US8283751B2Split-channel antifuse array architectureKURJANOWICZ WLODEK·Filed 2008·Granted Oct 9, 2012·21 cites·12 claims
- 0592US8933492B2Low VT antifuse deviceKURJANOWICZ WLODEK·Filed 2008·Granted Jan 13, 2015·25 cites·30 claims
- 0691US8767433B2Methods for testing unprogrammed OTP memoryKURJANOWICZ WLODEK·Filed 2012·Granted Jul 1, 2014·13 cites·15 claims
- 0786US8130532B2High speed OTP sensing schemeKURJANOWICZ WLODEK·Filed 2010·Granted Mar 6, 2012·7 cites·20 claims
- 0882US8471355B2AND-type one time programmable memory cellKURJANOWICZ WLODEK·Filed 2009·Granted Jun 25, 2013·9 cites·14 claims
- 0980US8223526B2Low power antifuse sensing scheme with improved reliabilityKURJANOWICZ WLODEK·Filed 2010·Granted Jul 17, 2012·5 cites·26 claims
- 1078US8059479B2Test circuit for an unprogrammed OTP memory arrayKURJANOWICZ WLODEK·Filed 2008·Granted Nov 15, 2011·10 cites·20 claims
- 1176US8313987B2Anti-fuse memory cellKURJANOWICZ WLODEK·Filed 2011·Granted Nov 20, 2012·3 cites·23 claims
- 1267US8082476B2Program verify method for OTP memoriesKURJANOWICZ WLODEK·Filed 2007·Granted Dec 20, 2011·4 cites·10 claims
- 1360US8266483B2Method for operating a register stage of a dual function data registerKURJANOWICZ WLODEK·Filed 2011·Granted Sep 11, 2012·1 cites·10 claims
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