Assignee
LAI DA-WEI
SG·16 granted patents·45 citations·filing 2010–2013
Top patents by PatentIndex Score
16 records- 0192US8400742B2Electrostatic discharge (ESD) protection circuits, integrated circuits, systems, and operating methods thereofLAI DA-WEI·Filed 2010·Granted Mar 19, 2013·14 cites·19 claims
- 0286US8823129B2Latch-up prevention structure and method for ultra-small high voltage tolerant cellLAI DA-WEI·Filed 2010·Granted Sep 2, 2014·9 cites·20 claims
- 0380US8848326B2Cross-domain ESD protection schemeLAI DA-WEI·Filed 2012·Granted Sep 30, 2014·6 cites·15 claims
- 0475US8913359B2Latch-up free RC-based NMOS ESD power clamp in HV useLAI DA-WEI·Filed 2012·Granted Dec 16, 2014·4 cites·13 claims
- 0574US9130010B2Latch-up robust SCR-based devicesLAI DA-WEI·Filed 2012·Granted Sep 8, 2015·3 cites·1 claims
- 0669US8797698B2Electrostatic discharge (ESD) protection and operating method thereofLAI DA-WEI·Filed 2013·Granted Aug 5, 2014·2 cites·20 claims
- 0766US8913357B2ESD protection circuitLAI DA-WEI·Filed 2012·Granted Dec 16, 2014·2 cites·16 claims
- 0866US8710545B2Latch-up free ESD protectionLAI DA-WEI·Filed 2012·Granted Apr 29, 2014·2 cites·20 claims
- 0961US8778743B2Latch-up robust PNP-triggered SCR-based devicesLAI DA-WEI·Filed 2012·Granted Jul 15, 2014·1 cites·20 claims
- 1060US8891215B2High noise immunity with latch-up free ESD clampLAI DA-WEI·Filed 2012·Granted Nov 18, 2014·1 cites·12 claims
- 1159US8792219B2ESD-robust I/O driver circuitsLAI DA-WEI·Filed 2012·Granted Jul 29, 2014·1 cites·20 claims
- 1252US9040367B2Latch-up immunity nLDMOSLAI DA-WEI·Filed 2012·Granted May 26, 2015·0 cites·8 claims
- 1347US8724271B2ESD-robust I/O driver circuitsLAI DA-WEI·Filed 2012·Granted May 13, 2014·0 cites·18 claims
- 1441US9154122B2Latch up detectionLAI DA-WEI·Filed 2012·Granted Oct 6, 2015·0 cites·15 claims
- 1541US8879221B2ESD protection without latch-upLAI DA-WEI·Filed 2012·Granted Nov 4, 2014·0 cites·20 claims
- 1640US8913358B2Latch-up immune ESD protectionLAI DA-WEI·Filed 2012·Granted Dec 16, 2014·0 cites·20 claims
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