Assignee
LAMB DAVID
BR·1 granted patent·2 pending applications·3 citations·filing 2006–2012
Top patents by PatentIndex Score
3 records- 0162US9121892B2Semiconductor circuit and methodology for in-system scan testingLAMB DAVID·Filed 2012·Granted Sep 1, 2015·3 cites·20 claims
- 0241US2008118332A1Drywall screwLAMB DAVID·Filed 2006·Application pending·0 cites
- 0324US2013135314A1Analysis methodLAMB DAVID·Filed 2010·Application pending·0 cites
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