Assignee
LEE CHAE YOON
KR·5 granted patents·1 pending application·31 citations·filing 2004–2012
Top patents by PatentIndex Score
6 records- 0185US9201093B2Inspection apparatus for semiconductor deviceLEE CHAE-YOON·Filed 2011·Granted Dec 1, 2015·10 cites·10 claims
- 0284US9128120B2ProbeLEE CHAE YOON·Filed 2010·Granted Sep 8, 2015·8 cites·5 claims
- 0379US8228086B2Socket for testing semiconductor chipLEE CHAE YOON·Filed 2010·Granted Jul 24, 2012·6 cites·19 claims
- 0452US7253647B2Probe for high electric currentLEE CHAE YOON·Filed 2004·Granted Aug 7, 2007·7 cites·4 claims
- 0543US9250264B2Coaxial probeLEE CHAE-YOON·Filed 2012·Granted Feb 2, 2016·0 cites·14 claims
- 0638US2012105090A1Probe device for testingLEE CHAE YOON·Filed 2009·Application pending·0 cites
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