Assignee

LEE CHII-CHANG

SG·1 granted patent·9 citations·filing 2007–2007

Technology mixG01R1

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1 record

0172US8253423B2Multiple line width electromigration test structure and methodLEE CHII-CHANG·Filed 2007·Granted Aug 28, 2012·9 cites·15 claims

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