Assignee
LEE JUN-TAEK
KR·1 granted patent·1 pending application·0 citations·filing 2005–2009
Top patents by PatentIndex Score
2 records- 0143US8587700B2Method of detecting defects in image sensor, tester for the method, and control signal generator for the methodLEE JUN-TAEK·Filed 2009·Granted Nov 19, 2013·0 cites·3 claims
- 0234US2005285166A1Monitoring patterns for an imaging device and method of monitoring a process using the monitoring patternsLEE JUN-TAEK·Filed 2005·Application pending·0 cites
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