Assignee
LEE SUN JUNG
KR·2 granted patents·1 pending application·2 citations·filing 2007–2008
Top patents by PatentIndex Score
3 records- 0162US8228069B2Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatusLEE SUN-JUNG·Filed 2008·Granted Jul 24, 2012·2 cites·17 claims
- 0245US8217393B2Test device, SRAM test device, semiconductor integrated circuit device and methods of fabricating the sameLEE SUN-JUNG·Filed 2008·Granted Jul 10, 2012·0 cites·25 claims
- 0336US2008067612A1Semiconductor Device Including Nickel Alloy Silicide Layer Having Uniform Thickness and Method of Manufacturing the SameLEE SUN JUNG·Filed 2007·Application pending·0 cites
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