Assignee
LEEDS & NORTHRUP
14 granted patents·397 citations·filing 1977–1979
Top patents by PatentIndex Score
14 records- 0191US4189367AMethod for testing ion selective electrodes in continuous measuring systemsLEEDS & NORTHRUP·Filed 1978·Granted Feb 19, 1980·88 cites·7 claims
- 0290US4240149AMeasuring systemLEEDS & NORTHRUP·Filed 1979·Granted Dec 16, 1980·69 cites·5 claims
- 0388US4241701AMethod and apparatus for controlling steam temperature at a boiler outletLEEDS & NORTHRUP·Filed 1979·Granted Dec 30, 1980·52 cites·5 claims
- 0488US4193063ADifferential capacitance measuring circuitLEEDS & NORTHRUP·Filed 1978·Granted Mar 11, 1980·56 cites·10 claims
- 0586US4242659AThin film resistance thermometer detector probe assemblyLEEDS & NORTHRUP·Filed 1979·Granted Dec 30, 1980·28 cites·7 claims
- 0673US4163903AFlame monitoring apparatusLEEDS & NORTHRUP·Filed 1977·Granted Aug 7, 1979·22 cites·5 claims
- 0769US4208908ASpeed of sound compensation for Doppler flowmeterLEEDS & NORTHRUP·Filed 1978·Granted Jun 24, 1980·19 cites·6 claims
- 0867US4179309AMeans for assembling expendable immersion thermocouplesLEEDS & NORTHRUP·Filed 1978·Granted Dec 18, 1979·23 cites·5 claims
- 0956US4151589ADecoupled cascade control systemLEEDS & NORTHRUP·Filed 1978·Granted Apr 24, 1979·13 cites·5 claims
- 1043US4174618ADecoupled cascade control systemLEEDS & NORTHRUP·Filed 1978·Granted Nov 20, 1979·11 cites·6 claims
- 1140US4213304ABoiler control systemLEEDS & NORTHRUP·Filed 1978·Granted Jul 22, 1980·7 cites·9 claims
- 1235US4209831AMethod and apparatus for controlling an interconnected distribution system which includes a jointly owned generating unitLEEDS & NORTHRUP·Filed 1978·Granted Jun 24, 1980·6 cites·2 claims
- 1330US4183245ASynchronous frequency-to-voltage converter for doppler apparatusLEEDS & NORTHRUP·Filed 1978·Granted Jan 15, 1980·2 cites·5 claims
- 1428US4156930AMultipoint recorder with randomly addressable input switching and printing meansLEEDS & NORTHRUP·Filed 1977·Granted May 29, 1979·1 cites·11 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →