Assignee
LENSKI MARKUS
DE·3 granted patents·2 pending applications·12 citations·filing 2005–2012
Top patents by PatentIndex Score
5 records- 0184US8298894B2Work function adjustment in high-k metal gate electrode structures by selectively removing a barrier layerLENSKI MARKUS·Filed 2010·Granted Oct 30, 2012·8 cites·12 claims
- 0274US8652917B2Superior stability of characteristics of transistors having an early formed high-K metal gateLENSKI MARKUS·Filed 2012·Granted Feb 18, 2014·4 cites·20 claims
- 0340US2009108415A1Increasing etch selectivity during the patterning of a contact structure of a semiconductor deviceLENSKI MARKUS·Filed 2008·Application pending·0 cites
- 0438US2005233532A1Method of forming sidewall spacersLENSKI MARKUS·Filed 2005·Application pending·0 cites
- 0534US8987103B2Multi-step deposition of a spacer material for reducing void formation in a dielectric material of a contact level of a semiconductor deviceLENSKI MARKUS·Filed 2010·Granted Mar 24, 2015·0 cites·21 claims
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