Assignee
LEPAGE BENOIT
CA·9 granted patents·4 pending applications·24 citations·filing 2008–2017
Top patents by PatentIndex Score
13 records- 0191US9625424B2System and a method of automatically generating a phased array ultrasound scan plan for non-destructive inspectionLEPAGE BENOIT·Filed 2015·Granted Apr 18, 2017·10 cites·25 claims
- 0289US8704513B2Shielded eddy current coils and methods for forming same on printed circuit boardsLEPAGE BENOIT·Filed 2011·Granted Apr 22, 2014·8 cites·19 claims
- 0376US8896300B22D coil and a method of obtaining EC response of 3D coils using the 2D coil configurationLEPAGE BENOIT·Filed 2010·Granted Nov 25, 2014·2 cites·17 claims
- 0471US8700342B2Multi-frequency bond testingLEPAGE BENOIT·Filed 2009·Granted Apr 15, 2014·3 cites·18 claims
- 0568US9110036B2Assembly with a universal manipulator for inspecting dovetail of different sizesLEPAGE BENOIT·Filed 2013·Granted Aug 18, 2015·1 cites·16 claims
- 0658US2018231508A1Ultrasonic inspection configuration with beam overlap verificationLEPAGE BENOIT·Filed 2017·Application pending·0 cites
- 0757US2013249540A1Eddy current array probe and method for lift-off compensation during operation without known lift referencesLEPAGE BENOIT·Filed 2012·Application pending·0 cites
- 0853US9316618B2Method for monitoring the integrity of an eddy current inspection channelLEPAGE BENOIT·Filed 2014·Granted Apr 19, 2016·0 cites·18 claims
- 0949US2009091318A1Phased scan eddy current array probe and a phased scanning method which provide complete and continuous coverage of a test surface without mechanical scanningLEPAGE BENOIT·Filed 2008·Application pending·0 cites
- 1044US8519702B2Orthogonal eddy current probe for multi-directional inspectionLEPAGE BENOIT·Filed 2010·Granted Aug 27, 2013·0 cites·16 claims
- 1141US2011234212A1Magnetic flux leakage inspection deviceLEPAGE BENOIT·Filed 2010·Application pending·0 cites
- 1240US9523660B2Method of conducting probe coupling calibration in a guided-wave inspection instrumentLEPAGE BENOIT·Filed 2015·Granted Dec 20, 2016·0 cites·20 claims
- 1335US10561404B2Gapless calibration method for phased array ultrasonic inspectionLEPAGE BENOIT·Filed 2017·Granted Feb 18, 2020·0 cites·32 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →