Assignee
LEU IYUN
TW·6 granted patents·1 pending application·32 citations·filing 2009–2011
Top patents by PatentIndex Score
7 records- 0190US8607169B2Intelligent defect diagnosis methodLEU IYUN·Filed 2011·Granted Dec 10, 2013·14 cites·6 claims
- 0290US8312401B2Method for smart defect screen and sampleLEU IYUN·Filed 2011·Granted Nov 13, 2012·9 cites·11 claims
- 0378US9129237B2Integrated interfacing system and method for intelligent defect yield solutionsLEU IYUN·Filed 2011·Granted Sep 8, 2015·3 cites·23 claims
- 0476US8908957B2Method for building rule of thumb of defect classification, and methods for classifying defect and judging killer defect based on rule of thumb and critical area analysisLEU IYUN·Filed 2011·Granted Dec 9, 2014·3 cites·4 claims
- 0558US8473223B2Method for utilizing fabrication defect of an articleLEU IYUN·Filed 2009·Granted Jun 25, 2013·2 cites·18 claims
- 0650US8095895B2Method for defect diagnosis and managementLEU IYUN·Filed 2009·Granted Jan 10, 2012·1 cites·13 claims
- 0748US2010332206A1Method for simulating leakage distribution of integrated circuit designLEU IYUN·Filed 2009·Application pending·0 cites
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