Assignee

LEVEL 3 INSPECTION LLC

US·0 granted patents·1 pending application·0 citations·filing 2017–2017

Technology mixG01B1 G01N1 G05B1 G06F1 G06T1 H04N1

Top patents by PatentIndex Score

1 record

0135US2017249729A1Automated optical metrology computer aided inspection station and method of operationLEVEL 3 INSPECTION LLC·Filed 2017·Application pending·0 cites

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