Assignee
LIBBERT JEFFREY L
US·4 granted patents·73 citations·filing 2010–2012
Top patents by PatentIndex Score
4 records- 0196US8846493B2Methods for producing silicon on insulator structures having high resistivity regions in the handle waferLIBBERT JEFFREY L·Filed 2012·Granted Sep 30, 2014·68 cites·35 claims
- 0282US8143078B2Methods for monitoring the amount of contamination imparted into semiconductor wafers during wafer processingLIBBERT JEFFREY L·Filed 2010·Granted Mar 27, 2012·4 cites·8 claims
- 0362US9343379B2Method to delineate crystal related defectsLIBBERT JEFFREY L·Filed 2011·Granted May 17, 2016·1 cites·11 claims
- 0453US8822242B2Methods for monitoring the amount of metal contamination in a processLIBBERT JEFFREY L·Filed 2012·Granted Sep 2, 2014·0 cites·19 claims
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