Assignee
LIN XIJIANG
US·5 granted patents·33 citations·filing 2007–2017
Top patents by PatentIndex Score
5 records- 0193US8290738B2Low power scan testing techniques and apparatusLIN XIJIANG·Filed 2011·Granted Oct 16, 2012·12 cites·31 claims
- 0284US7685491B2Test generation methods for reducing power dissipation and supply currentsLIN XIJIANG·Filed 2007·Granted Mar 23, 2010·11 cites·27 claims
- 0379US8890563B2Scan cell use with reduced power consumptionLIN XIJIANG·Filed 2009·Granted Nov 18, 2014·9 cites·14 claims
- 0466US8560906B2Timing-aware test generation and fault simulationLIN XIJIANG·Filed 2011·Granted Oct 15, 2013·1 cites·17 claims
- 0559US10509073B2Timing-aware test generation and fault simulationLIN XIJIANG·Filed 2017·Granted Dec 17, 2019·0 cites·11 claims
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