Assignee

LOGAN LYNDON R

US·1 granted patent·0 citations·filing 2011–2011

Technology mixG01R1 H10P1 H10W1

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1 record

0140US8709833B2Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variationsLOGAN LYNDON R·Filed 2011·Granted Apr 29, 2014·0 cites·18 claims

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