Assignee
LOU CHOON LEONG
TW·8 granted patents·5 pending applications·13 citations·filing 2009–2022
Top patents by PatentIndex Score
13 records- 0174US9329205B2High-precision semiconductor device probing apparatus and system thereofLOU CHOON LEONG·Filed 2012·Granted May 3, 2016·4 cites·18 claims
- 0274US8169227B2Probing apparatus with multiaxial stages for testing semiconductor devicesLOU CHOON LEONG·Filed 2009·Granted May 1, 2012·7 cites·19 claims
- 0367US8692570B2Probe card for testing high-frequency signalsLOU CHOON LEONG·Filed 2011·Granted Apr 8, 2014·2 cites·9 claims
- 0451US2023314475A1Probe structureLOU CHOON LEONG·Filed 2022·Application pending·0 cites
- 0549US8198725B2Heat sink and integrated circuit assembly using the sameLOU CHOON LEONG·Filed 2009·Granted Jun 12, 2012·0 cites·14 claims
- 0644US8188758B2Enclosed probe stationLOU CHOON LEONG·Filed 2009·Granted May 29, 2012·0 cites·10 claims
- 0743US2013048344A1High frequency circuit boardLOU CHOON LEONG·Filed 2011·Application pending·0 cites
- 0841US8389926B2Testing apparatus for light-emitting devices with a design for a removable sensing moduleLOU CHOON LEONG·Filed 2010·Granted Mar 5, 2013·0 cites·12 claims
- 0940US9885746B2Switching matrix and testing system for semiconductor characteristic measurement using the sameLOU CHOON LEONG·Filed 2012·Granted Feb 6, 2018·0 cites·23 claims
- 1039US2013229199A1Testing apparatus for performing avalanche testLOU CHOON LEONG·Filed 2012·Application pending·0 cites
- 1139US2013229200A1Testing apparatus for performing an avalanche test and method thereofLOU CHOON LEONG·Filed 2012·Application pending·0 cites
- 1236US8310264B2Method for configuring combinational switching matrix and testing system for semiconductor devices using the sameLOU CHOON LEONG·Filed 2009·Granted Nov 13, 2012·0 cites·22 claims
- 1336US2012043987A1Probe Card for Testing Semiconductor Devices and Vertical Probe ThereofLOU CHOON LEONG·Filed 2010·Application pending·0 cites
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