Assignee
LTX CORP
US·36 granted patents·1,200 citations·filing 1991–2008
Top patents by PatentIndex Score
36 records- 0194US6449741B1Single platform electronic testerLTX CORP·Filed 1998·Granted Sep 10, 2002·127 cites·11 claims
- 0289US5694063AHigh speed IDDQ monitor circuitLTX CORP·Filed 1996·Granted Dec 2, 1997·115 cites·19 claims
- 0388US6675339B1Single platform electronic testerLTX CORP·Filed 2001·Granted Jan 6, 2004·36 cites·5 claims
- 0486US6332212B1Capturing and displaying computer program execution timingLTX CORP·Filed 1997·Granted Dec 18, 2001·188 cites·38 claims
- 0586US5717704ATest system including a local trigger signal generator for each of a plurality of test instrumentsLTX CORP·Filed 1996·Granted Feb 10, 1998·76 cites·33 claims
- 0684US7191368B1Single platform electronic testerLTX CORP·Filed 2001·Granted Mar 13, 2007·28 cites·10 claims
- 0783US6942019B2Apparatus and method for circuit board liquid coolingLTX CORP·Filed 2002·Granted Sep 13, 2005·46 cites·23 claims
- 0883US6665185B1Apparatus and method for embedded fluid cooling in printed circuit boardsLTX CORP·Filed 2002·Granted Dec 16, 2003·46 cites·29 claims
- 0982US6625557B1Mixed signal device under test board interfaceLTX CORP·Filed 1998·Granted Sep 23, 2003·63 cites·22 claims
- 1080US7092837B1Single platform electronic testerLTX CORP·Filed 2003·Granted Aug 15, 2006·28 cites·4 claims
- 1180US5200696ATest system apparatus with Schottky diodes with programmable voltagesLTX CORP·Filed 1991·Granted Apr 6, 1993·57 cites·6 claims
- 1279US7196566B2High-resolution variable attenuation deviceLTX CORP·Filed 2003·Granted Mar 27, 2007·28 cites·26 claims
- 1378US6703825B1Separating device response signals from composite signalsLTX CORP·Filed 2003·Granted Mar 9, 2004·19 cites·17 claims
- 1478US5191295APhase shift vernier for automatic test systemsLTX CORP·Filed 1992·Granted Mar 2, 1993·45 cites·11 claims
- 1577US5694377ADifferential time interpolatorLTX CORP·Filed 1996·Granted Dec 2, 1997·61 cites·30 claims
- 1674US6563298B1Separating device response signals from composite signalsLTX CORP·Filed 2000·Granted May 13, 2003·16 cites·25 claims
- 1772US6700396B1Integrated micromachine relay for automated test equipment applicationsLTX CORP·Filed 2001·Granted Mar 2, 2004·14 cites·23 claims
- 1872US5311486ATiming generation in an automatic electrical test systemLTX CORP·Filed 1992·Granted May 10, 1994·27 cites·27 claims
- 1968US6560756B1Method and apparatus for distributed test pattern decompressionLTX CORP·Filed 2001·Granted May 6, 2003·17 cites·44 claims
- 2065US6512989B1Generating and controlling analog and digital signals on a mixed signal test systemLTX CORP·Filed 1999·Granted Jan 28, 2003·26 cites·37 claims
- 2162US5552744AHigh speed IDDQ monitor circuitLTX CORP·Filed 1995·Granted Sep 3, 1996·26 cites·8 claims
- 2261US7849374B1Testing a transceiverLTX CORP·Filed 2006·Granted Dec 7, 2010·4 cites·19 claims
- 2361US6052810ADifferential driver circuit for use in automatic test equipmentLTX CORP·Filed 1998·Granted Apr 18, 2000·23 cites·19 claims
- 2457US7664621B2System and method for mapping system transfer functionsLTX CORP·Filed 2008·Granted Feb 16, 2010·4 cites·21 claims
- 2554US7231561B2Apparatus and method for data pattern alignmentLTX CORP·Filed 2002·Granted Jun 12, 2007·10 cites·14 claims
- 2654US6903562B1Integrated micromachine relay for automated test equipment applicationsLTX CORP·Filed 2003·Granted Jun 7, 2005·5 cites·17 claims
- 2750US6418387B1Method of and system for generating a binary shmoo plot in N-dimensional spaceLTX CORP·Filed 1999·Granted Jul 9, 2002·16 cites·26 claims
- 2850US6211723B1Programmable load circuit for use in automatic test equipmentLTX CORP·Filed 1999·Granted Apr 3, 2001·18 cites·22 claims
- 2947US7919968B2System and method for distortion analysisLTX CORP·Filed 2007·Granted Apr 5, 2011·1 cites·15 claims
- 3045US7035887B2Apparatus and method for data shiftingLTX CORP·Filed 2002·Granted Apr 25, 2006·3 cites·17 claims
- 3142US6323694B1Differential comparator with a programmable voltage offset for use in an automatic testerLTX CORP·Filed 1998·Granted Nov 27, 2001·10 cites·21 claims
- 3240US6489797B1Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristicsLTX CORP·Filed 1999·Granted Dec 3, 2002·12 cites·27 claims
- 3336US6728651B1Methods and apparatuses for digitally tuning a phased-lock loop circuitLTX CORP·Filed 2002·Granted Apr 27, 2004·4 cites·24 claims
- 3432US7512857B1Pattern correction circuitLTX CORP·Filed 2005·Granted Mar 31, 2009·0 cites·11 claims
- 3521US6768960B2System for and method of performing device-oriented testsLTX CORP·Filed 2001·Granted Jul 27, 2004·0 cites·11 claims
- 3621US5964445ALoad counterbalancing system with a constant load displacement forceLTX CORP·Filed 1997·Granted Oct 12, 1999·1 cites·25 claims
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