Assignee
LY TAI AN
US·6 granted patents·203 citations·filing 2003–2010
Top patents by PatentIndex Score
6 records- 0195US7356789B2Metastability effects simulation for a circuit descriptionLY TAI AN·Filed 2005·Granted Apr 8, 2008·58 cites·49 claims
- 0294US8438516B2Metastability effects simulation for a circuit descriptionLY TAI AN·Filed 2010·Granted May 7, 2013·23 cites·18 claims
- 0392US7454728B2Metastability injector for a circuit descriptionLY TAI AN·Filed 2007·Granted Nov 18, 2008·27 cites·30 claims
- 0491US7243322B1Metastability injector for a circuit descriptionLY TAI AN·Filed 2004·Granted Jul 10, 2007·56 cites·24 claims
- 0589US7712062B2Metastability effects simulation for a circuit descriptionLY TAI AN·Filed 2008·Granted May 4, 2010·18 cites·21 claims
- 0677US7007249B2Method for automatically generating checkers for finding functional defects in a description of circuitLY TAI AN·Filed 2003·Granted Feb 28, 2006·21 cites·15 claims
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