Assignee
MAEKAWA KAZUYOSHI
JP·3 granted patents·32 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0194US8432037B2Semiconductor device with a line and method of fabrication thereofMAEKAWA KAZUYOSHI·Filed 2012·Granted Apr 30, 2013·21 cites·9 claims
- 0281US8125085B2Semiconductor device having wiring with oxide layer of impurity from the wiringMAEKAWA KAZUYOSHI·Filed 2009·Granted Feb 28, 2012·11 cites·16 claims
- 0351US8222146B2Semiconductor device with a line and method of fabrication thereofMAEKAWA KAZUYOSHI·Filed 2011·Granted Jul 17, 2012·0 cites·20 claims
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