Assignee
MAKIYAMA KOZO
JP·11 granted patents·2 pending applications·21 citations·filing 2008–2012
Top patents by PatentIndex Score
13 records- 0186US8183558B2Compound semiconductor device with T-shaped gate electrodeMAKIYAMA KOZO·Filed 2011·Granted May 22, 2012·7 cites·10 claims
- 0284US8587092B2Semiconductor device and manufacturing method of the sameMAKIYAMA KOZO·Filed 2008·Granted Nov 19, 2013·8 cites·14 claims
- 0371US8133775B2Semiconductor device with mushroom electrode and manufacture method thereofMAKIYAMA KOZO·Filed 2011·Granted Mar 13, 2012·2 cites·8 claims
- 0467US8410616B2Method of processing resist, semiconductor device, and method of producing the sameMAKIYAMA KOZO·Filed 2010·Granted Apr 2, 2013·1 cites·2 claims
- 0565US8816408B2Compound semiconductor device and manufacturing method thereofMAKIYAMA KOZO·Filed 2010·Granted Aug 26, 2014·2 cites·18 claims
- 0662US8709886B2Compound semiconductor device and manufacturing method thereforMAKIYAMA KOZO·Filed 2012·Granted Apr 29, 2014·1 cites·6 claims
- 0755US8399361B2Semiconductor device and method of manufacturing the sameMAKIYAMA KOZO·Filed 2012·Granted Mar 19, 2013·0 cites·6 claims
- 0854US8227838B2Semiconductor device and method of manufacturing the sameMAKIYAMA KOZO·Filed 2011·Granted Jul 24, 2012·0 cites·5 claims
- 0954US8163653B2Semiconductor device and method of manufacturing the sameMAKIYAMA KOZO·Filed 2011·Granted Apr 24, 2012·0 cites·5 claims
- 1051US8207067B2Method of processing resist, semiconductor device, and method of producing the sameMAKIYAMA KOZO·Filed 2010·Granted Jun 26, 2012·0 cites·18 claims
- 1142US8227895B2Capacitor and semiconductor deviceMAKIYAMA KOZO·Filed 2011·Granted Jul 24, 2012·0 cites·20 claims
- 1240US2013069129A1Compound semiconductor device and method of manufacturing the sameMAKIYAMA KOZO·Filed 2012·Application pending·0 cites
- 1338US2012146728A1Compound semiconductor device and method of manufacturing the sameMAKIYAMA KOZO·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →