Assignee

MAKUUCHI MASAMI

JP·2 granted patents·0 citations·filing 2011–2011

Technology mixG01N2 H01M1 Y02E1 Y02P1 Y02T1

Top patents by PatentIndex Score

2 records

0148US9261475B2Inspection equipment and inspection methodMAKUUCHI MASAMI·Filed 2011·Granted Feb 16, 2016·0 cites·18 claims
0244US8908171B2Defect inspection method and defect inspection deviceMAKUUCHI MASAMI·Filed 2011·Granted Dec 9, 2014·0 cites·10 claims

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