Assignee
MATRIX ELECTRONIC MEASURING PROPERTIES LLC
US·3 granted patents·2 citations·filing 2008–2012
Top patents by PatentIndex Score
3 records- 0154US8345953B2Stereoscopic measurement system and methodMATRIX ELECTRONIC MEASURING PROPERTIES LLC·Filed 2008·Granted Jan 1, 2013·2 cites·21 claims
- 0244US9482515B2Stereoscopic measurement system and methodMATRIX ELECTRONIC MEASURING PROPERTIES LLC·Filed 2012·Granted Nov 1, 2016·0 cites·38 claims
- 0344US9454822B2Stereoscopic measurement system and methodMATRIX ELECTRONIC MEASURING PROPERTIES LLC·Filed 2012·Granted Sep 27, 2016·0 cites·29 claims
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