Assignee
MAY HIGH TECH SOLUTIONS LTD
IL·1 granted patent·1 pending application·3 citations·filing 2005–2013
Top patents by PatentIndex Score
2 records- 0169US9013688B2Method for optical inspection, detection and analysis of double sided wafer macro defectsMAY HIGH TECH SOLUTIONS LTD·Filed 2013·Granted Apr 21, 2015·3 cites·17 claims
- 0229US2009136117A1Method and apparatus for residue detection on a polished waferMAY HIGH TECH SOLUTIONS LTD·Filed 2005·Application pending·0 cites
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