Assignee
MEEKS STEVEN W
6 granted patents·77 citations·filing 2006–2013
Top patents by PatentIndex Score
6 records- 0192US7362425B2Wide spatial frequency topography and roughness measurementMEEKS STEVEN W·Filed 2006·Granted Apr 22, 2008·42 cites·14 claims
- 0291US8848181B1Multi-surface scattered radiation differentiationMEEKS STEVEN W·Filed 2013·Granted Sep 30, 2014·10 cites·19 claims
- 0390US8836935B1Optical inspector with selective scattered radiation blockerMEEKS STEVEN W·Filed 2013·Granted Sep 16, 2014·9 cites·19 claims
- 0482US8823935B1Detecting and classifying surface defects with multiple radiation collectorsMEEKS STEVEN W·Filed 2009·Granted Sep 2, 2014·12 cites·10 claims
- 0577US8896825B2Optical inspectorMEEKS STEVEN W·Filed 2013·Granted Nov 25, 2014·4 cites·17 claims
- 0650US8830456B2Optical inspectorMEEKS STEVEN W·Filed 2013·Granted Sep 9, 2014·0 cites·20 claims
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