Assignee
MEIRYO TEKUNIKA KABUSHIKI KAIS
US·2 granted patents·40 citations·filing 1997–1998
Top patents by PatentIndex Score
2 records- 0160US5966195AMethod of determining cell thickness and twist angle parameters of liquid crystal cellMEIRYO TEKUNIKA KABUSHIKI KAIS·Filed 1997·Granted Oct 12, 1999·25 cites·20 claims
- 0246US6300954B1Methods and apparatus for detecting liquid crystal display parameters using stokes parametersMEIRYO TEKUNIKA KABUSHIKI KAIS·Filed 1998·Granted Oct 9, 2001·15 cites·26 claims
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