Assignee
METRON SYSTEMS INC
US·6 granted patents·104 citations·filing 2000–2003
Top patents by PatentIndex Score
6 records- 0185US6441908B1Profiling of a component having reduced sensitivity to anomalous off-axis reflectionsMETRON SYSTEMS INC·Filed 2000·Granted Aug 27, 2002·35 cites·10 claims
- 0284US6822748B2Calibration for 3D measurement systemMETRON SYSTEMS INC·Filed 2003·Granted Nov 23, 2004·34 cites·41 claims
- 0380US6940891B2High precision optical imaging systems and related systemsMETRON SYSTEMS INC·Filed 2003·Granted Sep 6, 2005·23 cites·50 claims
- 0453US6825922B2Determination of the angular position of a laser beamMETRON SYSTEMS INC·Filed 2003·Granted Nov 30, 2004·7 cites·71 claims
- 0552US6870631B2Profiling of a component having reduced sensitivity to anomalous off-axis reflectionsMETRON SYSTEMS INC·Filed 2002·Granted Mar 22, 2005·5 cites·1 claims
- 0636US6785007B2Profiling of a component having reduced sensitivity to anomalous off-axis reflectionsMETRON SYSTEMS INC·Filed 2002·Granted Aug 31, 2004·0 cites·23 claims
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