Assignee
METROPTIC TECHNOLOGIES LTD
IL·2 granted patents·111 citations·filing 1998–1998
Top patents by PatentIndex Score
2 records- 0181US6094269AApparatus and method for optically measuring an object surface contourMETROPTIC TECHNOLOGIES LTD·Filed 1998·Granted Jul 25, 2000·78 cites·24 claims
- 0247US6636310B1Wavelength-dependent surface contour measurement system and methodMETROPTIC TECHNOLOGIES LTD·Filed 1998·Granted Oct 21, 2003·33 cites·102 claims
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