Assignee
MFI TECHNOLOGIES CORP
US·2 granted patents·40 citations·filing 1999–2000
Top patents by PatentIndex Score
2 records- 0167US6298715B1Scanning force microscope probe cantilever with reflective structureMFI TECHNOLOGIES CORP·Filed 1999·Granted Oct 9, 2001·37 cites·23 claims
- 0234US6377066B1Method and apparatus for sub-micron imaging and probing on probe stationMFI TECHNOLOGIES CORP·Filed 2000·Granted Apr 23, 2002·3 cites·33 claims
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