Assignee
MICRO EPSILON MESSTECHNIK GMBH & CO KG
DE·19 granted patents·8 pending applications·22 citations·filing 2012–2022
Top patents by PatentIndex Score
27 records- 0184US10036657B2Capacitive sensor comprising integrated heating elementMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2014·Granted Jul 31, 2018·6 cites·20 claims
- 0279US9677947B2Temperature sensorMICRO-EPSILON MESSTECHNIK GMBH & CO KG·Filed 2012·Granted Jun 13, 2017·6 cites·2 claims
- 0376US10234274B2Method for thickness measurement on measurement objects and device for applying the methodMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2014·Granted Mar 19, 2019·6 cites·15 claims
- 0467US12417869B2Electromagnetic actuatorMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2021·Granted Sep 16, 2025·0 cites·12 claims
- 0565US10502591B2Sensor arrangement and method for determining a position and/or a change in the position of a measurement objectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2015·Granted Dec 10, 2019·1 cites·19 claims
- 0664US11125550B2Method and device for optically measuring the surface of a measurement objectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2018·Granted Sep 21, 2021·1 cites·9 claims
- 0758US11313664B2Device for measuring the thickness of coatingsMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2018·Granted Apr 26, 2022·1 cites·21 claims
- 0857US10060762B2Inductive sensor comprising integrated soft magnetic layer and method for the production thereofMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2014·Granted Aug 28, 2018·1 cites·22 claims
- 0952US11828583B2Device for determining the thickness of an objectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2019·Granted Nov 28, 2023·0 cites·20 claims
- 1048US2021364277A1Method and device for optically measuring the surface of a measurement objectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2021·Application pending·0 cites
- 1147US12518914B2Coil assemblyMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2021·Granted Jan 6, 2026·0 cites·3 claims
- 1247US11614614B2Reluctance actuatorMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2018·Granted Mar 28, 2023·0 cites·38 claims
- 1346US10001388B2Circuit arrangement and method for controlling a displacement measurement sensorMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2015·Granted Jun 19, 2018·0 cites·18 claims
- 1446US2023188009A1Sensor system and method for operating a sensor systemMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2021·Application pending·0 cites
- 1545US11092432B2Reference plate and method for calibrating and/or checking a deflectometry sensor systemMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2017·Granted Aug 17, 2021·0 cites·21 claims
- 1645US2024271928A1Method and Device for Measuring a Measurement ObjectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2022·Application pending·0 cites
- 1741US2024318987A1Sensor and system comprising a sensor and a fastening deviceMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2022·Application pending·0 cites
- 1840US10184784B2Device and method for measuring the width and thickness of a flat objectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2016·Granted Jan 22, 2019·0 cites·23 claims
- 1940US2024241623A1Method and measurement system for carrying out and/or displaying a measurement processMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2022·Application pending·0 cites
- 2039US10890435B2Device for measuring the geometry of the inner wall of bores and corresponding methodMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2016·Granted Jan 12, 2021·0 cites·10 claims
- 2138US2020309574A1Displacement sensor operating without contactMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2018·Application pending·0 cites
- 2237US12510352B2Method and system for optically measuring an object having a specular and/or partially specular surface and corresponding measuring arrangementMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2020·Granted Dec 30, 2025·0 cites·20 claims
- 2337US10700698B2Linearization circuit and method for linearizing a measurement signalMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2017·Granted Jun 30, 2020·0 cites·19 claims
- 2435US11333481B2Device and sensor for contactless distance and/or position determination of a measurement objectMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2016·Granted May 17, 2022·0 cites·13 claims
- 2532US2019003857A1Sensor and sensor elementMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2017·Application pending·0 cites
- 2631US2018011005A1Apparatus for inline trace analysis of a liquidMICRO-EPSILON MESSTECHNIK GMBH & CO KG·Filed 2016·Application pending·0 cites
- 2727US11095061B2Electrical plug connectorMICRO EPSILON MESSTECHNIK GMBH & CO KG·Filed 2018·Granted Aug 17, 2021·0 cites·10 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →