Assignee
MINEKAWA YOHEI
JP·3 granted patents·21 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0190US9401015B2Defect classification method, and defect classification systemMINEKAWA YOHEI·Filed 2012·Granted Jul 26, 2016·12 cites·14 claims
- 0281US8824773B2Defect observation method and defect observation deviceMINEKAWA YOHEI·Filed 2010·Granted Sep 2, 2014·6 cites·20 claims
- 0371US9342879B2Method and apparatus for reviewing defectMINEKAWA YOHEI·Filed 2012·Granted May 17, 2016·3 cites·17 claims
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