Assignee
MITUTOYO CORP
JP·1,442 granted patents·178 pending applications·18,228 citations·filing 1987–2025
Top patents by PatentIndex Score
1,620 records- 0199US4879508ACapacitance-type measuring device for absolute measurement of positionsMITUTOYO CORP·Filed 1988·Granted Nov 7, 1989·135 cites·32 claims
- 0298US9143674B2Machine vision inspection system and method for performing high-speed focus height measurement operationsMITUTOYO CORP·Filed 2013·Granted Sep 22, 2015·60 cites·18 claims
- 0398US7626705B2Chromatic sensor lens configurationMITUTOYO CORP·Filed 2007·Granted Dec 1, 2009·142 cites·17 claims
- 0498US7130320B2External cavity laser with rotary tuning elementMITUTOYO CORP·Filed 2003·Granted Oct 31, 2006·124 cites·20 claims
- 0598US6011389AInduced current position transducer having a low power electronic circuitMITUTOYO CORP·Filed 1997·Granted Jan 4, 2000·228 cites·37 claims
- 0698US5187874ACoordinate measuring machine with protected origin point blocksMITUTOYO CORP·Filed 1990·Granted Feb 23, 1993·253 cites·4 claims
- 0797US11781935B2Housing unitMITUTOYO CORP·Filed 2022·Granted Oct 10, 2023·3 cites·9 claims
- 0897US11150200B1Workpiece inspection and defect detection system indicating number of defect images for trainingMITUTOYO CORP·Filed 2020·Granted Oct 19, 2021·27 cites·24 claims
- 0997US9930243B2Variable focal length imaging systemMITUTOYO CORP·Filed 2016·Granted Mar 27, 2018·26 cites·16 claims
- 1097US9835473B2Absolute electromagnetic position encoderMITUTOYO CORP·Filed 2016·Granted Dec 5, 2017·18 cites·15 claims
- 1197US9830694B2Multi-level image focus using a tunable lens in a machine vision inspection systemMITUTOYO CORP·Filed 2015·Granted Nov 28, 2017·30 cites·20 claims
- 1297US9736355B1Phase difference calibration in a variable focal length lens systemMITUTOYO CORP·Filed 2016·Granted Aug 15, 2017·37 cites·20 claims
- 1397US7876456B2Intensity compensation for interchangeable chromatic point sensor componentsMITUTOYO CORP·Filed 2009·Granted Jan 25, 2011·64 cites·20 claims
- 1497US7652275B2Non-contact probe control interfaceMITUTOYO CORP·Filed 2006·Granted Jan 26, 2010·70 cites·18 claims
- 1597US7608813B1Scale track configuration for absolute optical encoder including a detector electronics with plurality of track detector portionsMITUTOYO CORP·Filed 2008·Granted Oct 27, 2009·90 cites·28 claims
- 1697US7043852B2Measuring instrumentMITUTOYO CORP·Filed 2004·Granted May 16, 2006·1.4k cites·9 claims
- 1797US7030351B2Systems and methods for rapidly automatically focusing a machine vision inspection systemMITUTOYO CORP·Filed 2003·Granted Apr 18, 2006·135 cites·48 claims
- 1897US6642506B1Speckle-image-based optical position transducer having improved mounting and directional sensitivitiesMITUTOYO CORP·Filed 2000·Granted Nov 4, 2003·129 cites·33 claims
- 1997US4878013ACapacitive type measurement transducer with improved electrode arrangementMITUTOYO CORP·Filed 1988·Granted Oct 31, 1989·107 cites·10 claims
- 2096US11713983B2Sensing winding configuration for inductive position encoderMITUTOYO CORP·Filed 2021·Granted Aug 1, 2023·5 cites·22 claims
- 2196US11268874B2Defect judging unit of measuring probe and defect judging method thereofMITUTOYO CORP·Filed 2020·Granted Mar 8, 2022·8 cites·14 claims
- 2296US11067414B1Transmitter and receiver configuration for inductive position encoderMITUTOYO CORP·Filed 2020·Granted Jul 20, 2021·7 cites·18 claims
- 2396US11002529B2Robot system with supplementary metrology position determination systemMITUTOYO CORP·Filed 2020·Granted May 11, 2021·5 cites·21 claims
- 2496US10751883B2Robot system with supplementary metrology position coordinates determination systemMITUTOYO CORP·Filed 2018·Granted Aug 25, 2020·26 cites·23 claims
- 2596US10551217B2Receiver line spacing in inductive position encoderMITUTOYO CORP·Filed 2018·Granted Feb 4, 2020·15 cites·12 claims
- 2696US10520335B2Winding configuration for inductive position encoderMITUTOYO CORP·Filed 2016·Granted Dec 31, 2019·21 cites·20 claims
- 2796US10145666B2Touch probe for CMM including digital signal communicationMITUTOYO CORP·Filed 2016·Granted Dec 4, 2018·19 cites·16 claims
- 2896US9958294B2Absolute position encoder including scale with varying spatial characteristic and utilizing Fourier transform or other signal processingMITUTOYO CORP·Filed 2016·Granted May 1, 2018·24 cites·23 claims
- 2996US9791262B2Measurement device with multiplexed position signalsMITUTOYO CORP·Filed 2015·Granted Oct 17, 2017·18 cites·23 claims
- 3096US9778072B1Absolute electromagnetic position encoderMITUTOYO CORP·Filed 2016·Granted Oct 3, 2017·12 cites·19 claims
- 3196US9772202B1Absolute position encoder combining signals of two widely separated wavelengthsMITUTOYO CORP·Filed 2016·Granted Sep 26, 2017·14 cites·20 claims
- 3296US9618312B2Measuring probeMITUTOYO CORP·Filed 2015·Granted Apr 11, 2017·17 cites·22 claims
- 3396US9612136B1Absolute position encoder including a redundant spatial phase signalMITUTOYO CORP·Filed 2015·Granted Apr 4, 2017·19 cites·20 claims
- 3496US9080899B2Optical displacement encoder having plural scale grating portions with spatial phase offset of scale pitchMITUTOYO CORP·Filed 2014·Granted Jul 14, 2015·17 cites·24 claims
- 3596US9018578B2Adaptable resolution optical encoder having structured illumination and spatial filteringMITUTOYO CORP·Filed 2012·Granted Apr 28, 2015·22 cites·19 claims
- 3696US8055466B2Global calibration for stereo vision probeMITUTOYO CORP·Filed 2008·Granted Nov 8, 2011·76 cites·17 claims
- 3796US7454053B2System and method for automatically recovering video tools in a vision systemMITUTOYO CORP·Filed 2004·Granted Nov 18, 2008·182 cites·20 claims
- 3896US7324682B2System and method for excluding extraneous features from inspection operations performed by a machine vision inspection systemMITUTOYO CORP·Filed 2004·Granted Jan 29, 2008·155 cites·21 claims
- 3996US7286246B2Method and apparatus for non-contact three-dimensional surface measurementMITUTOYO CORP·Filed 2004·Granted Oct 23, 2007·89 cites·8 claims
- 4096US6542180B1Systems and methods for adjusting lighting of a part based on a plurality of selected regions of an image of the partMITUTOYO CORP·Filed 2000·Granted Apr 1, 2003·208 cites·21 claims
- 4196US5973494AElectronic caliper using a self-contained, low power inductive position transducerMITUTOYO CORP·Filed 1996·Granted Oct 26, 1999·154 cites·51 claims
- 4296US5886519AMulti-scale induced current absolute position transducerMITUTOYO CORP·Filed 1997·Granted Mar 23, 1999·204 cites·21 claims
- 4396US5841274AInduced current absolute position transducer using a code-track-type scale and read headMITUTOYO CORP·Filed 1997·Granted Nov 24, 1998·139 cites·40 claims
- 4496US5104225APosition detector and method of measuring positionMITUTOYO CORP·Filed 1991·Granted Apr 14, 1992·125 cites·28 claims
- 4596US5053715ACapacitance-type measuring device for absolute measurement of positionsMITUTOYO CORP·Filed 1990·Granted Oct 1, 1991·103 cites·6 claims
- 4695US11644298B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2020·Granted May 9, 2023·8 cites·20 claims
- 4795US11644299B2Inductive position sensor signal gain control for coordinate measuring machine probeMITUTOYO CORP·Filed 2020·Granted May 9, 2023·5 cites·23 claims
- 4895US11543899B2Inductive position detection configuration for indicating a measurement device stylus position and including coil misalignment compensationMITUTOYO CORP·Filed 2020·Granted Jan 3, 2023·9 cites·20 claims
- 4995US10914570B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2019·Granted Feb 9, 2021·15 cites·25 claims
- 5095US10866080B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2018·Granted Dec 15, 2020·16 cites·18 claims
Showing the top 50 of 1,620 patent records by PatentIndex Score.
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