Assignee
MIWA KENJI
JP·1 granted patent·2 pending applications·0 citations·filing 1998–2012
Top patents by PatentIndex Score
3 records- 0147US8237826B2Image sensing apparatus, method for controlling the same, and programMIWA KENJI·Filed 2009·Granted Aug 7, 2012·0 cites·4 claims
- 0236US2014176683A1Imaging apparatus and method for controlling sameMIWA KENJI·Filed 2012·Application pending·0 cites
- 0321US2006096732A1Method of refinement of microstructure of metallic materialsMIWA KENJI·Filed 1998·Application pending·0 cites
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