Assignee
MIYA GO
JP·3 granted patents·6 pending applications·18 citations·filing 2005–2012
Top patents by PatentIndex Score
9 records- 0184US8232522B2Semiconductor inspecting apparatusMIYA GO·Filed 2009·Granted Jul 31, 2012·8 cites·14 claims
- 0282US8083889B2Apparatus and method for plasma etchingMIYA GO·Filed 2009·Granted Dec 27, 2011·6 cites·2 claims
- 0380US8519332B2Semiconductor inspecting apparatusMIYA GO·Filed 2012·Granted Aug 27, 2013·4 cites·15 claims
- 0457US2009095423A1Apparatus and method for plasma etchingMIYA GO·Filed 2008·Application pending·0 cites
- 0553US2009152241A1Plasma etching apparatus and plasma etching methodMIYA GO·Filed 2009·Application pending·0 cites
- 0649US2008110569A1Plasma etching apparatus and plasma etching methodMIYA GO·Filed 2007·Application pending·0 cites
- 0742US2007209759A1Plasma etching apparatus and plasma etching methodMIYA GO·Filed 2006·Application pending·0 cites
- 0840US2006169671A1Plasma etching apparatus and plasma etching methodMIYA GO·Filed 2005·Application pending·0 cites
- 0937US2012186745A1Plasma processing apparatusMIYA GO·Filed 2011·Application pending·0 cites
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