Assignee
MIYAGAWA HIROMITSU
JP·4 granted patents·7 citations·filing 2013–2021
Top patents by PatentIndex Score
4 records- 0174US9077927B2Image inspection system and image inspection method for determining a threshold useable for defect detection in a scanned image based upon a reference image with an artificial defectMIYAGAWA HIROMITSU·Filed 2013·Granted Jul 7, 2015·4 cites·15 claims
- 0271US9313341B2Image test apparatus and system for calculating a stack position of a sheet including a defective imageMIYAGAWA HIROMITSU·Filed 2014·Granted Apr 12, 2016·3 cites·20 claims
- 0348US11470207B2Image processing apparatus, image processing system, image processing method, and non-transitory computer-readable storage mediumMIYAGAWA HIROMITSU·Filed 2021·Granted Oct 11, 2022·0 cites·10 claims
- 0428US9727807B2Image processing system, image generation-output control apparatus, and method of processing information, configured to use imposition conversionMIYAGAWA HIROMITSU·Filed 2016·Granted Aug 8, 2017·0 cites·8 claims
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