Assignee
MIYAZAKI YOJI
JP·11 granted patents·3 pending applications·222 citations·filing 2010–2017
Top patents by PatentIndex Score
14 records- 0195US8272881B2Connector having a lock mechanism for keeping a socket and a header coupled, and method for manufacturing the connectorMIYAZAKI YOJI·Filed 2010·Granted Sep 25, 2012·40 cites·20 claims
- 0292US8992233B2Connector having a reduced height and increased soldering strength and socket for use in the sameMIYAZAKI YOJI·Filed 2011·Granted Mar 31, 2015·23 cites·8 claims
- 0392USD684120SConnectorMIYAZAKI YOJI·Filed 2012·Granted Jun 11, 2013·48 cites·1 claims
- 0486US8562379B2Socket and connectorMIYAZAKI YOJI·Filed 2011·Granted Oct 22, 2013·18 cites·19 claims
- 0583USD687383SConnectorMIYAZAKI YOJI·Filed 2012·Granted Aug 6, 2013·28 cites·1 claims
- 0679USD681557SConnectorMIYAZAKI YOJI·Filed 2012·Granted May 7, 2013·21 cites·1 claims
- 0774USD684541SConnectorMIYAZAKI YOJI·Filed 2012·Granted Jun 18, 2013·19 cites·1 claims
- 0870USD687382SConnectorMIYAZAKI YOJI·Filed 2012·Granted Aug 6, 2013·16 cites·1 claims
- 0969US9190751B2Connector and header for use in the sameMIYAZAKI YOJI·Filed 2011·Granted Nov 17, 2015·6 cites·13 claims
- 1067US9298739B2Position information providing apparatus, position information providing system, position information providing method, program, and recording mediumMIYAZAKI YOJI·Filed 2011·Granted Mar 29, 2016·2 cites·12 claims
- 1150US2013096982A1Interest level estimation apparatus, interest level estimation method, and computer-readable recording mediumMIYAZAKI YOJI·Filed 2011·Application pending·0 cites
- 1250US2012317066A1Interest level measurement system, interest level measurement device, interest level measurement method, and interest level measurement programMIYAZAKI YOJI·Filed 2011·Application pending·0 cites
- 1333USD684540SConnectorMIYAZAKI YOJI·Filed 2012·Granted Jun 18, 2013·1 cites·1 claims
- 1431US2020328540A1Connector, header, and socketMIYAZAKI YOJI·Filed 2017·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →