Assignee
MULTIPROBE INC
US·4 granted patents·2 pending applications·25 citations·filing 2003–2015
Top patents by PatentIndex Score
6 records- 0169US7415868B2Deconvolving tip artifacts using multiple scanning probesMULTIPROBE INC·Filed 2006·Granted Aug 26, 2008·5 cites·16 claims
- 0264US6880389B2Software synchronization of multiple scanning probesMULTIPROBE INC·Filed 2003·Granted Apr 19, 2005·11 cites·15 claims
- 0355US6951130B2Software synchronization of multiple scanning probesMULTIPROBE INC·Filed 2004·Granted Oct 4, 2005·7 cites·11 claims
- 0447US7444857B2Software synchronization of multiple scanning probesMULTIPROBE INC·Filed 2005·Granted Nov 4, 2008·2 cites·15 claims
- 0542US2010148813A1Apparatus and method for combined micro-scale and nano-scale c-v, q-v, and i-v testing of semiconductor materialsMULTIPROBE INC·Filed 2007·Application pending·0 cites
- 0627US2015338627A1Apparatus and method for atomic force, near-field scanning optical microscopyMULTIPROBE INC·Filed 2015·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →