Assignee
MULTITEST ELEKTRONISCHE SYSTEME GMBH
DE·7 granted patents·1 pending application·9 citations·filing 2013–2017
Top patents by PatentIndex Score
8 records- 0183US9933457B2Device for testing electronic componentsMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2015·Granted Apr 3, 2018·8 cites·11 claims
- 0258US10290526B2Device and method for aligning and holding a plurality of singulated semiconductor components in receiving pockets of a terminal carrierMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2014·Granted May 14, 2019·0 cites·14 claims
- 0356US9541600B2Method for positioning a carrier with a plurality of electronic components in a device for testing the electronic componentsMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2014·Granted Jan 10, 2017·1 cites·8 claims
- 0440US10156588B2Contact tip and contact element and method of producing the sameMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2015·Granted Dec 18, 2018·0 cites·7 claims
- 0536US9671428B2Contact spring for a testing base for the high current testing of an electronic componentMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2013·Granted Jun 6, 2017·0 cites·4 claims
- 0633US10466130B2Test device, a test system and a method for testing a mechanical pressure sensorMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2017·Granted Nov 5, 2019·0 cites·17 claims
- 0733US9618534B2Guide and support member for a device for testing electronic componentsMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2015·Granted Apr 11, 2017·0 cites·16 claims
- 0831US2018172760A1Contact device and a method of testing a singulated electronic component using a contact deviceMULTITEST ELEKTRONISCHE SYSTEME GMBH·Filed 2017·Application pending·0 cites
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