Assignee
NAGAHAMA ICHIROTA
JP·1 granted patent·1 pending application·3 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0168US8611638B2Pattern inspection method and pattern inspection apparatusNAGAHAMA ICHIROTA·Filed 2011·Granted Dec 17, 2013·3 cites·6 claims
- 0240US2010021046A1Pattern inspection apparatus, pattern inspection method and computer readable recording mediumNAGAHAMA ICHIROTA·Filed 2009·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when NAGAHAMA ICHIROTA files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →