Assignee
NAKAGAKI RYO
JP·5 granted patents·4 pending applications·44 citations·filing 2008–2012
Top patents by PatentIndex Score
9 records- 0195US8452076B2Defect classifier using classification recipe based on connection between rule-based and example-based classifiersNAKAGAKI RYO·Filed 2012·Granted May 28, 2013·20 cites·4 claims
- 0290US8150141B2Defect classifier using classification recipe based on connection between rule-based and example-based classifiersNAKAGAKI RYO·Filed 2011·Granted Apr 3, 2012·10 cites·6 claims
- 0376US8526710B2Defect review method and apparatusNAKAGAKI RYO·Filed 2008·Granted Sep 3, 2013·7 cites·16 claims
- 0476US8090190B2Method and apparatus for reviewing defectsNAKAGAKI RYO·Filed 2010·Granted Jan 3, 2012·4 cites·4 claims
- 0575US9335277B2Region-of-interest determination apparatus, observation tool or inspection tool, region-of-interest determination method, and observation method or inspection method using region-of-interest determination methodNAKAGAKI RYO·Filed 2012·Granted May 10, 2016·3 cites·15 claims
- 0649US2011261190A1Defect observation device and defect observation methodNAKAGAKI RYO·Filed 2009·Application pending·0 cites
- 0739US2013222574A1Defect classification system and defect classification device and imaging deviceNAKAGAKI RYO·Filed 2011·Application pending·0 cites
- 0838US2012257041A1Method for defect inspection and apparatus for defect inspectionNAKAGAKI RYO·Filed 2010·Application pending·0 cites
- 0936US2014177940A1Recipe generation apparatus, inspection support apparatus, inspection system, and recording mediaNAKAGAKI RYO·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →