Assignee
NAKAMURA MASARU
JP·13 granted patents·2 pending applications·82 citations·filing 1997–2012
Top patents by PatentIndex Score
15 records- 0191US8570019B2Switching power source apparatusNAKAMURA MASARU·Filed 2011·Granted Oct 29, 2013·12 cites·13 claims
- 0291US8258763B2Switching power supply unit and control circuit for sameNAKAMURA MASARU·Filed 2010·Granted Sep 4, 2012·37 cites·11 claims
- 0377US8614872B2Switching power source apparatusNAKAMURA MASARU·Filed 2011·Granted Dec 24, 2013·5 cites·6 claims
- 0473US8605708B2System, device and method for TDMA-based networking using space division multiplexed transmissionsNAKAMURA MASARU·Filed 2011·Granted Dec 10, 2013·5 cites·16 claims
- 0568US9099546B2Workpiece dividing method including two laser beam application stepsNAKAMURA MASARU·Filed 2011·Granted Aug 4, 2015·2 cites·8 claims
- 0667US8625449B2Wireless access systemNAKAMURA MASARU·Filed 2011·Granted Jan 7, 2014·2 cites·3 claims
- 0766US8787859B2Automatic gain control apparatus and methodNAKAMURA MASARU·Filed 2012·Granted Jul 22, 2014·2 cites·12 claims
- 0863US8593124B2Switching power source apparatusNAKAMURA MASARU·Filed 2011·Granted Nov 26, 2013·2 cites·6 claims
- 0957US8704505B2Switching power source apparatusNAKAMURA MASARU·Filed 2011·Granted Apr 22, 2014·1 cites·12 claims
- 1053US8704126B2Laser beam machining apparatusNAKAMURA MASARU·Filed 2008·Granted Apr 22, 2014·0 cites·4 claims
- 1149USD398618SVertical numerically controlled milling machineNAKAMURA MASARU·Filed 1997·Granted Sep 22, 1998·10 cites·1 claims
- 1245US8267784B2Game system and computer readable medium including a marker position determination portionNAKAMURA MASARU·Filed 2010·Granted Sep 18, 2012·0 cites·17 claims
- 1342US2007004177A1Wafer processing methodNAKAMURA MASARU·Filed 2006·Application pending·0 cites
- 1438US2013252432A1Patterning methodNAKAMURA MASARU·Filed 2011·Application pending·0 cites
- 1534USD389845SMilling machineNAKAMURA MASARU·Filed 1997·Granted Jan 27, 1998·4 cites·1 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →