Assignee
NAKAUCHI AKIHIRO
JP·3 granted patents·1 pending application·1 citations·filing 2010–2011
Top patents by PatentIndex Score
4 records- 0153US8314937B2Measurement method and measurement apparatus that measure a surface figure of an aspheric surface based on an interference patternNAKAUCHI AKIHIRO·Filed 2010·Granted Nov 20, 2012·1 cites·8 claims
- 0239US9719773B2Measuring method and measuring apparatusNAKAUCHI AKIHIRO·Filed 2010·Granted Aug 1, 2017·0 cites·20 claims
- 0337US2012010850A1Measurement apparatus and methodNAKAUCHI AKIHIRO·Filed 2011·Application pending·0 cites
- 0436US8868366B2Calculation method and calculation apparatusNAKAUCHI AKIHIRO·Filed 2010·Granted Oct 21, 2014·0 cites·6 claims
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