Assignee
NANODEVICES INC
US·4 granted patents·336 citations·filing 1998–2000
Top patents by PatentIndex Score
4 records- 0194US6279389B1AFM with referenced or differential height measurementNANODEVICES INC·Filed 2000·Granted Aug 28, 2001·57 cites·5 claims
- 0290US6196061B1AFM with referenced or differential height measurementNANODEVICES INC·Filed 1998·Granted Mar 6, 2001·108 cites·32 claims
- 0390US6189374B1Active probe for an atomic force microscope and method of use thereofNANODEVICES INC·Filed 1999·Granted Feb 20, 2001·96 cites·43 claims
- 0488US6530266B1Active probe for an atomic force microscope and method of use thereofNANODEVICES INC·Filed 1999·Granted Mar 11, 2003·75 cites·49 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →