Assignee
NANOFOCUS AG
DE·6 granted patents·10 citations·filing 2001–2017
Top patents by PatentIndex Score
6 records- 0159US8023184B2Device and method for high-intensity uniform illumination with minimal light reflection for use in microscopesNANOFOCUS AG·Filed 2007·Granted Sep 20, 2011·3 cites·4 claims
- 0255US8014053B2Method for generating a universal pinhole pattern for use in confocal microscopesNANOFOCUS AG·Filed 2007·Granted Sep 6, 2011·2 cites·4 claims
- 0344US6943823B2Method and device for producing height images of technical surfaces with microscopic resolutionNANOFOCUS AG·Filed 2001·Granted Sep 13, 2005·5 cites·21 claims
- 0440US11029143B2Method and device for optical surface measurement by means of a chromatic confocal sensorNANOFOCUS AG·Filed 2017·Granted Jun 8, 2021·0 cites·13 claims
- 0534US10627214B2Method for electronically analyzing a signal changing over timeNANOFOCUS AG·Filed 2017·Granted Apr 21, 2020·0 cites·11 claims
- 0624US6853459B2Scanning using position transmission for triggering the recording of measured valuesNANOFOCUS AG·Filed 2001·Granted Feb 8, 2005·0 cites·13 claims
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