Assignee
NANRI TERUTAKA
JP·2 granted patents·1 pending application·2 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0164US8933423B2Charged particle beam device and sample production methodNANRI TERUTAKA·Filed 2012·Granted Jan 13, 2015·2 cites·29 claims
- 0236US10233548B2Charged particle beam device and sample production methodNANRI TERUTAKA·Filed 2011·Granted Mar 19, 2019·0 cites·17 claims
- 0335US2013277552A1Charged particle beam device and method of manufacture of sampleNANRI TERUTAKA·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →