Assignee
NEARFIELD INSTR B V
NL·7 granted patents·12 pending applications·0 citations·filing 2021–2023
Top patents by PatentIndex Score
19 records- 0157US12546800B2Automated landing method of a scanning probe microscopy system and scanning probe microscopy system using the sameNEARFIELD INSTR B V·Filed 2022·Granted Feb 10, 2026·0 cites·20 claims
- 0252US2024393363A1Active dither balancing of a motion stage for scanning probe microscopyNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 0351US2024288468A1Method of and system for refurbishing a probe for use in a scanning probe microscopy device, and a computer program product for performing said methodNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 0450US12529876B2Compact optical microscope, metrology device comprising the optical microscope and a wafer positioning metrology apparatus comprising the metrology deviceNEARFIELD INSTR B V·Filed 2022·Granted Jan 20, 2026·0 cites·20 claims
- 0550US2024241151A1System for performing atomic force microscopy, including a grid plate qualification toolNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 0649US2024295583A1Positioning system and methodNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 0749US2024027491A1Cassette for holding a probeNEARFIELD INSTR B V·Filed 2021·Application pending·0 cites
- 0848US12346036B2Alignment system and method for aligning an object having an alignment markNEARFIELD INSTR B V·Filed 2021·Granted Jul 1, 2025·0 cites·20 claims
- 0948US2025383369A1Method of and scanning probe microscopy system for measuring a topography of a side wall of a structure on a surface of a substrateNEARFIELD INSTR B V·Filed 2023·Application pending·0 cites
- 1046US2025067769A1Scanning probe microscopy system and method of operating such a systemNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 1146US2025004010A1Atomic force microscope (afm) device and method of operating the sameNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 1245US2024275130A1Laser diode arrangement, method of operating a laser diode and scanning microscope device comprising a laser diodeNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 1344US12523678B2Probe cassette and method for storing, transporting and handling one or more probe devices for a probe based systemNEARFIELD INSTR B V·Filed 2021·Granted Jan 13, 2026·0 cites·17 claims
- 1440US2024210443A1Fiducial marker design, fiducial marker, scanning probe microscopy device and method of calibrating a position of a probe tipNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 1540US2024210442A1Method of calibrating in a scanning probe microscopy system an optical microscope, calibration structure and scanning probe microscopy deviceNEARFIELD INSTR B V·Filed 2022·Application pending·0 cites
- 1638US12429496B2Arrangement for and method of determining cantilever deflection in a scanning probe microscopy systemNEARFIELD INSTR B V·Filed 2021·Granted Sep 30, 2025·0 cites·22 claims
- 1734US12523676B2Method of monitoring at least one of an overlay or an alignment between layers of a semiconductor substrate, scanning probe microscopy system and computer programNEARFIELD INSTR B V·Filed 2021·Granted Jan 13, 2026·0 cites·17 claims
- 1832US2023213552A1A probe cassette for storing, transporting and handling one or more probe devices for a probe based systemNEARFIELD INSTR B V·Filed 2021·Application pending·0 cites
- 1928US12123895B2Method of determining dimensions of features of a subsurface topography, scanning probe microscopy system and computer programNEARFIELD INSTR B V·Filed 2021·Granted Oct 22, 2024·0 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when NEARFIELD INSTR B V files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →