Assignee
NEGEVTECH LTD
IL·9 granted patents·3 pending applications·131 citations·filing 2003–2009
Top patents by PatentIndex Score
12 records- 0194US7369236B1Defect detection through image comparison using relative measuresNEGEVTECH LTD·Filed 2006·Granted May 6, 2008·28 cites·23 claims
- 0292US7274444B2Multi mode inspection method and apparatusNEGEVTECH LTD·Filed 2005·Granted Sep 25, 2007·17 cites·32 claims
- 0389US7180586B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2004·Granted Feb 20, 2007·29 cites·12 claims
- 0487US6892013B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2003·Granted May 10, 2005·32 cites·14 claims
- 0581US7477383B2System for detection of wafer defectsNEGEVTECH LTD·Filed 2006·Granted Jan 13, 2009·5 cites·15 claims
- 0676US7525659B2System for detection of water defectsNEGEVTECH LTD·Filed 2003·Granted Apr 28, 2009·13 cites·3 claims
- 0775US7260298B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2005·Granted Aug 21, 2007·6 cites·11 claims
- 0866US7486861B2Fiber optical illumination systemNEGEVTECH LTD·Filed 2007·Granted Feb 3, 2009·1 cites·17 claims
- 0958US7480039B2Multi mode inspection method and apparatusNEGEVTECH LTD·Filed 2007·Granted Jan 20, 2009·0 cites·12 claims
- 1055US2009225307A1Wafer inspection using short-pulsed continuous broadband illuminationNEGEVTECH LTD·Filed 2009·Application pending·0 cites
- 1142US2006012781A1Programmable spatial filter for wafer inspectionNEGEVTECH LTD·Filed 2004·Application pending·0 cites
- 1241US2008037933A1Speckle reduction using a fiber bundle and light guideNEGEVTECH LTD·Filed 2006·Application pending·0 cites
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