Assignee

NENYEI ZSOLT

DE·1 granted patent·1 pending application·1 citations·filing 2004–2008

Technology mixH10P2 C25D1 G05D1

Top patents by PatentIndex Score

2 records

0155US8575521B2Monitoring witness structures for temperature control in RTP systemsNENYEI ZSOLT·Filed 2008·Granted Nov 5, 2013·1 cites·3 claims
0233US2007117413A1Process for the production of a nitrogenous layer a semiconductor or metal surfaceNENYEI ZSOLT·Filed 2004·Application pending·0 cites

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